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Part No
Brand
Specification
MPQ|MOQ
Delivery Date
Operation
Part No
Brand
Specification
MPQ|MOQ
Delivery Date
Operation
ON Semiconductor
Batch:1933
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:2
6-12 Days
ON Semiconductor
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1000
MOQ:1000
6-12 Days
ON Semiconductor
Batch:2050
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:2
6-12 Days
Texas Instruments
Scan Test Device
MPQ:2000
MOQ:2000
6-12 Days
ON Semiconductor
Batch:2206
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:7
6-12 Days
ON Semiconductor
Batch:2016
Eliminator -55°C to 125°C Automotive ...
MPQ:47
MOQ:47
6-12 Days
ON Semiconductor
Batch:2141
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:2
6-12 Days
Texas Instruments
Batch:1644
Scan Test Device
MPQ:1
MOQ:2
6-12 Days
ON Semiconductor
Batch:2118
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:2
6-12 Days
Texas Instruments
Batch:2047
Scan Test Device
MPQ:160
MOQ:160
6-12 Days
ON Semiconductor
Batch:2026
Eliminator -55°C to 125°C 16-Pin SOIC...
MPQ:1
MOQ:3
6-12 Days
Texas Instruments
Batch:1606
Scan Test Device -40°C to 85°C 56-Pin...
MPQ:20
MOQ:20
6-12 Days
Texas Instruments
Dual Complementary Pair Plus Inverter...
MPQ:2500
MOQ:2500
6-12 Days
Texas Instruments
Batch:1727
Scan Test Device -40°C to 85°C 64-Pin...
MPQ:160
MOQ:160
6-12 Days
Texas Instruments
Batch:1727
Scan Test Device -40°C to 85°C 64-Pin...
MPQ:1
MOQ:1
6-12 Days
Texas Instruments
Batch:1825
Scan Test Device -40°C to 85°C 64-Pin...
MPQ:1
MOQ:1
6-12 Days
Texas Instruments
Batch:1817
Scan Test Device
MPQ:40
MOQ:40
6-12 Days
Texas Instruments
Batch:1619
Scan-Path Linker 0°C to 70°C 28-Pin S...
MPQ:20
MOQ:20
6-12 Days
Texas Instruments
Addressable Scan Port -40°C 85°C 24-P...
MPQ:50
MOQ:50
6-12 Days
Texas Instruments
Scan Test Device -40°C to 85°C 64-Pin...
MPQ:2000
MOQ:2000
6-12 Days

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